We kindly invite you to listen to the seminar series of Prof. Dr. Artūras Vailionis (Stanford University, USA), which will take place on 18-21 November.
Instructor: Dr. Arturas Vailionis, e-mail: a.vailionis@stanford.edu
Course: Introduction to Experimental X-ray Diffraction Techniques
This course covers experimental x-ray diffraction techniques used for analyzing the microstructure of materials. Topics include powder diffraction, as well as diffraction techniques for polycrystalline and epitaxial thin films, multilayers, and amorphous materials, using both medium and high-resolution setups.
Students will learn methods for assessing phase purity, crystallinity, relaxation, stress, and texture in materials. The course also introduces advanced techniques, such as reciprocal lattice mapping, x-ray reflectivity, and grazing incidence diffraction.
Schedule for November 2024:
| Date | Lectures | Room |
|
11/18 9:00 – 13:00 |
Properties of X-rays. Geometry of Crystals. Introduction to Reciprocal Lattice. Diffractometer Geometry. X-ray Optics. Detectors. Kinematical Theory of X-ray Diffraction. |
Studentų str. 50-232a |
|
11/19 9:00 – 13:00 |
Powder Method. Powder Diffraction File. Diffraction from Real Samples. Thin Film Structural Analysis. Stress & Texture Measurements. |
Studentų str. 50-232a |
|
11/20 9:00 – 13:00 |
Stress & Texture Measurements. X-ray Reflectivity. Epitaxial Layers. Rocking Curve, Mismatch, Reciprocal Space Mapping. |
Studentų str. 50-232a |
|
11/21 9:00 – 11:00 |
Practical examples. Discussions. | Studentų str. 50-238 |
